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Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge

2024-07-02

ALEXANDRIA, Virginia, July 2 -- SEMILAB SEMICONDUCTOR PHYSICS LABORATORY CO., LTD., Budapest, Hungary has been assigned a patent (No. US 12027430 B1, initially filed March 17, 2023) developed by five inventors Marshall D. Wilson, Tampa, Florida; Jacek Lagowski, Tampa, Florida; Carlos Almeida, Tampa, Florida; Bret Schrayer, Tampa, Florida; and Alexandre Savtchouk, Tampa, Florida, for "Semiconductor doping characterization method using photoneutralization time constant of corona surface charge." . . .

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Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge

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