JEDEC Publishes Essential Test Method to Address Switching Energy Loss in Wide Bandgap and Silicon Semiconductor Power Devices
September 12, 2024
September 12, 2024
ARLINGTON, Virginia, Sept. 12 -- JEDEC Solid State Technology Association issued the following news release:
JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry, today announced the publication of JEP200: Test Methods for Switching Energy Loss Associated with Output Capacitance Hysteresis in Semiconductor Power Devices. Developed jointly by JEDEC's JC-70.1 Gallium Nitride and JC-70.2 Silicon Carbide Subco . . .
JEDEC Solid State Technology Association, the global leader in the development of standards for the microelectronics industry, today announced the publication of JEP200: Test Methods for Switching Energy Loss Associated with Output Capacitance Hysteresis in Semiconductor Power Devices. Developed jointly by JEDEC's JC-70.1 Gallium Nitride and JC-70.2 Silicon Carbide Subco . . .