AFM Resolution Boosted by AI
April 26, 2024
April 26, 2024
MATERIALS PARK, Ohio, April 26 (TNSres) -- ASM International posted the following news from Atomic force microscopy:
Atomic force microscopy (AFM), is a widely used technique that can quantitatively map material surfaces in three dimensions, although its accuracy is limited by the size of the microscope's probe. A new artificial intelligence (AI) technique overcomes this limitation and allows microscopes to resolve material features smaller than the probe's tip.
Atomic force microscopy (AFM), is a widely used technique that can quantitatively map material surfaces in three dimensions, although its accuracy is limited by the size of the microscope's probe. A new artificial intelligence (AI) technique overcomes this limitation and allows microscopes to resolve material features smaller than the probe's tip.